- Patent Title: Shape inspection device, processing device, height image processing device using characteristic points in combination with correcetion reference regions to correct height measurements
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Application No.: US17749174Application Date: 2022-05-20
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Publication No.: US12000688B2Publication Date: 2024-06-04
- Inventor: Kaoru Kanayama , Takashi Atoro
- Applicant: Keyence Corporation
- Applicant Address: JP Osaka
- Assignee: KEYENCE CORPORATION
- Current Assignee: KEYENCE CORPORATION
- Current Assignee Address: JP Osaka
- Agency: Kilyk & Bowersox, P.L.L.C.
- Priority: JP 21119958 2021.07.20
- Main IPC: G01B11/02
- IPC: G01B11/02 ; G01B11/25 ; G06T7/50 ; G06T7/60

Abstract:
Provided are a shape inspection device, a processing device, a height image processing method, and a height image processing program capable of accurately inspecting a measurement object. A profile data generation unit sequentially generates a plurality of pieces of profile data as the measurement object relatively moves in a Y-axis direction. A height image generation unit extracts characteristic points for the respective pieces of profile data, and moves the respective pieces of profile data in a plane intersecting with a Y axis such that the extracted characteristic points are aligned in a line in a direction corresponding to the Y axis. Then, the height image generation unit arranges the moved profile data in a direction corresponding to the Y axis to correct a height image.
Public/Granted literature
- US20230026608A1 SHAPE INSPECTION DEVICE, PROCESSING DEVICE, HEIGHT IMAGE PROCESSING DEVICE Public/Granted day:2023-01-26
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