Invention Grant
- Patent Title: Probe apparatus
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Application No.: US17605101Application Date: 2020-03-05
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Publication No.: US12000862B2Publication Date: 2024-06-04
- Inventor: Masashi Kobayashi
- Applicant: HIOKI E.E. CORPORATION
- Applicant Address: JP Nagano
- Assignee: HIOKI E.E. CORPORATION
- Current Assignee: HIOKI E.E. CORPORATION
- Current Assignee Address: JP Nagano
- Agency: GREENBLUM & BERNSTEIN P.L.C.
- Priority: JP 19085595 2019.04.26
- International Application: PCT/JP2020/009347 2020.03.05
- International Announcement: WO2020/217729A 2020.10.29
- Date entered country: 2021-10-20
- Main IPC: G01R1/00
- IPC: G01R1/00 ; G01R1/067

Abstract:
The probe apparatus has a probe (first metal plate) as a signal terminal and a probe (second metal plate) as a ground terminal. A probe holder has a holder main body formed of a conductor, clamps that are formed of a dielectric and capable of clamping the probes, and a fixing member and a male screw (or “fixture”) capable of fixing both clamps, which have clamped the probes, to the holder main body. The probes are clamped by the two clamps in a state where the probes have been aligned along the plate surface direction, parts at front-end portion sides of the probes protrude from the two clamps, and the parts at front-end portion sides are capable of elastic deformation along the plate thickness direction.
Public/Granted literature
- US20220206042A1 PROBE APPARATUS Public/Granted day:2022-06-30
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