Invention Grant
- Patent Title: Sampling measurement method, system, computer device and storage medium
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Application No.: US17506767Application Date: 2021-10-21
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Publication No.: US12000882B2Publication Date: 2024-06-04
- Inventor: Xianfeng Ming , Jinguang Li
- Applicant: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Applicant Address: CN Hefei
- Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee Address: CN Hefei
- Agency: Cooper Legal Group, LLC
- Priority: CN 2110260844.X 2021.03.10
- Main IPC: G01R31/26
- IPC: G01R31/26

Abstract:
Provided are a sampling measurement method and system, computer device and storage medium. The sampling measurement method includes: acquiring a preset measurement ratio of each process element in a process station; acquiring an actual measurement ratio of a process element associated with a lot of products to be measured that arrive at the measurement station in the process station; and, when the actual measurement ratio of the associated process element is less than the corresponding preset measurement ratio, controlling a measurement machine at the measurement station to measure the lot of products to be measured.
Public/Granted literature
- US20220291275A1 SAMPLING MEASUREMENT METHOD, SYSTEM, COMPUTER DEVICE AND STORAGE MEDIUM Public/Granted day:2022-09-15
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