Invention Grant
- Patent Title: Integrated circuit testing device with coupled control of thermal system
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Application No.: US17566071Application Date: 2021-12-30
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Publication No.: US12000884B2Publication Date: 2024-06-04
- Inventor: Jerry Ihor Tustaniwskyj
- Applicant: Delta Design, Inc.
- Applicant Address: US CA Poway
- Assignee: Delta Design, Inc.
- Current Assignee: Delta Design, Inc.
- Current Assignee Address: US CA Poway
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01K1/02

Abstract:
A system includes a plurality of thermally-coupled zones and a plurality of thermal control devices, each controllable to thermally control one of the plurality of zones, and a plurality of temperature sensors, each configured to measure temperature of one of the plurality of zones. The system includes a control circuit configured to receive a temperature measurement for each of the plurality of zones, collect the temperature measurements in a temperature vector in a real coordinate system, and transform the temperature vector to a normal coordinate system that provides a plurality of uncoupled equations. The control circuit is configured to determine, based on the plurality of uncoupled equations and a desired temperature gradient, a desired power vector in the normal coordinate system, transform the desired power vector to the real coordinate system to generate a power vector, and control the plurality of heaters in accordance with the power vector.
Public/Granted literature
- US20220206060A1 INTEGRATED CIRCUIT TESTING DEVICE WITH COUPLED CONTROL OF THERMAL SYSTEM Public/Granted day:2022-06-30
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