Invention Grant
- Patent Title: Self-test circuit and a method of checking the integrity of a signal through a signal path
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Application No.: US15830046Application Date: 2017-12-04
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Publication No.: US12000886B2Publication Date: 2024-06-04
- Inventor: Julian Franchitti
- Applicant: Aktiebolaget SKF
- Applicant Address: SE Gothenburg
- Assignee: AKTIEBOLAGET SKF
- Current Assignee: AKTIEBOLAGET SKF
- Current Assignee Address: SE Gothenburg
- Agency: J-TEK LAW PLLC
- Agent Scott T. Wakeman; Mark A. Ussai
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R29/22 ; H01L21/66

Abstract:
Examples provide for a self-test circuit. The self-test circuit comprises input circuitry; testing circuitry; and a circuit to be tested, coupled between the input and testing circuitry and comprising at least a piezoelectric crystal. The input circuitry is configured to generate and transfer a predefined electric signal comprising at least a sinusoidal signal through at least the piezoelectric crystal of the circuit to be tested to generate an output signal. The testing circuitry is configured to analyze the output signal.
Public/Granted literature
- US20190170813A1 SELF-TEST CIRCUIT AND A METHOD OF CHECKING THE INTEGRITY OF A SIGNAL THROUGH A SIGNAL PATH Public/Granted day:2019-06-06
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