Invention Grant
- Patent Title: Device under test (DUT) measurement circuit having harmonic minimization
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Application No.: US17589779Application Date: 2022-01-31
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Publication No.: US12000892B2Publication Date: 2024-06-04
- Inventor: Charles Kasimer Sestok, IV , David Patrick Magee
- Applicant: TEXAS INSTRUMENTS INCORPORATED
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Frank D. Cimino
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/3167 ; G01R31/319 ; H03M1/06 ; H03M1/10

Abstract:
A circuit configured to: generate a reference clock signal; generate an excitation signal at a target frequency having a period that is a first integer number of cycles of the reference clock signal; update a driver circuit at an update frequency having a period that is a second integer number of cycles of the reference clock signal; digitize sense signals resulting from the excitation signal at a frequency having a period that is a third integer number of cycles of the reference clock signal; identify a fourth integer number of sense signal samples; optionally utilize an excitation control signal having a period that is a fifth integer number of cycles of the reference clock signal; and minimize harmonics at the target frequency of the excitation signal based on the first integer number, the second integer number, the third integer number, the fourth integer number, and possibly the fifth integer number.
Public/Granted literature
- US20220268838A1 DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZATION Public/Granted day:2022-08-25
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