Invention Grant
- Patent Title: Touch panel and repairing method therefor, and display device
-
Application No.: US17802541Application Date: 2021-10-13
-
Publication No.: US12001625B2Publication Date: 2024-06-04
- Inventor: Lei Zhang , Tieyi Zhang , Tao Peng , Chuanrui Gong , Yancen Liu
- Applicant: MIANYANG BOE OPTOELECTRONICS TECHNOLOGY CO., Ltd. , BOE Technology Group Co., Ltd.
- Applicant Address: CN Sichuan
- Assignee: MIANYANG BOE OPTOELECTRONICS TECHNOLOGY CO., Ltd.,BOE Technology Group Co., Ltd.
- Current Assignee: MIANYANG BOE OPTOELECTRONICS TECHNOLOGY CO., Ltd.,BOE Technology Group Co., Ltd.
- Current Assignee Address: CN Sichuan; CN Beijing
- Agency: Ling and Yang Intellectual Property
- Agent Ling Wu; Stephen Yang
- Priority: CN 2011262773.9 2020.11.12
- International Application: PCT/CN2021/123466 2021.10.13
- International Announcement: WO2022/100343A 2022.05.19
- Date entered country: 2022-08-26
- Main IPC: G06F3/041
- IPC: G06F3/041 ; G06F3/044 ; G09G3/3208

Abstract:
A touch panel, comprising: a substrate, a plurality of touch electrodes and a plurality of traces disposed on the substrate. At least one trace is connected to at least one touch electrode, and comprises a first conducting wire and a second conducting wire. A trace insulating layer is provided between the first and second conducting wires. The second conducting wire is connected to the first conducting wire by at least one via on the trace insulating layer. First conducting wires of at least two adjacent traces both have at least one break point, so that a first short circuit point between the first conducting wire is isolated from a corresponding second conducting wire; or, second conducting wires of at least two adjacent traces both have at least one break point, so that a second short circuit point between the second conducting wire is isolated from a corresponding first conducting wire.
Public/Granted literature
- US20230078853A1 TOUCH PANEL AND REPAIRING METHOD THEREFOR, AND DISPLAY DEVICE Public/Granted day:2023-03-16
Information query