Invention Grant
- Patent Title: Utilizing last successful read voltage level in memory access operations
-
Application No.: US17894540Application Date: 2022-08-24
-
Publication No.: US12001680B2Publication Date: 2024-06-04
- Inventor: Kyungjin Kim
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G06F3/06
- IPC: G06F3/06

Abstract:
An example method of performing read operation with respect to a memory device comprises: receiving a request to perform a read operation with respect to a memory page of a memory device; identifying a block family associated with a block comprising the memory page; determining a block family-based read voltage level associated with the block family; performing, using the block family-based read voltage level, a read operation with respect to the memory page; determining, by performing an error correction operation with respect to the memory page, a new read voltage level associated with the block family; and associating, by a last successful read voltage level memory data structure, the new read voltage level as a last the successful read voltage level with the block family.
Public/Granted literature
- US20240069734A1 UTILIZING LAST SUCCESSFUL READ VOLTAGE LEVEL IN MEMORY ACCESS OPERATIONS Public/Granted day:2024-02-29
Information query