Invention Grant
- Patent Title: Character defect detection method and device
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Application No.: US17594142Application Date: 2020-10-30
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Publication No.: US12002198B2Publication Date: 2024-06-04
- Inventor: Shiyu Li , Yifan Zhang , Jifeng Tian
- Applicant: GOERTEK INC.
- Applicant Address: CN Shandong
- Assignee: GOERTEK INC.
- Current Assignee: GOERTEK INC.
- Current Assignee Address: CN Shandong
- Agency: LKGlobal | Lorenz & Kopf, LLP
- Priority: CN 1911397495.5 2019.12.30
- International Application: PCT/CN2020/125318 2020.10.30
- International Announcement: WO2021/135605A 2021.07.08
- Date entered country: 2021-10-04
- Main IPC: G06T7/90
- IPC: G06T7/90 ; G06T3/02 ; G06T7/00 ; G06T11/00 ; G06V30/14

Abstract:
A character defect detection method and device are disclosed. The character defect detection method comprises: acquiring an image to be inspected containing a character and a template character image corresponding to the character, and converting the image to be inspected into an image having a format consistent with a format of the template character image; extracting a first valid area containing the character from the image to be inspected, and extracting a second valid area containing a template character from the template character image; obtaining a first image based on the first valid area, and obtaining a second image based on the second valid area; calculating a transformed image indicating an information difference between the first image and the second image based on the first image and the second image; and obtaining a character defect detection result of the image to be inspected based on information of the transformed image.
Public/Granted literature
- US20220172337A1 CHARACTER DEFECT DETECTION METHOD AND DEVICE Public/Granted day:2022-06-02
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