Invention Grant
- Patent Title: System to detect dielectric changes in matter
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Application No.: US17370983Application Date: 2021-07-08
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Publication No.: US12002584B2Publication Date: 2024-06-04
- Inventor: Leeor Alon , Seena Dehkharghani
- Applicant: NEW YORK UNIVERSITY
- Applicant Address: US NY New York
- Assignee: New York University
- Current Assignee: New York University
- Current Assignee Address: US NY New York
- Agency: Foley & Lardner LLP
- Main IPC: G16H50/20
- IPC: G16H50/20 ; G06N3/08 ; G16H10/60 ; G16H30/20 ; G16H40/63

Abstract:
Systems and methods for detecting dielectric changes in matter are provided. The system includes a data collection array to collect microwave scattering data and a machine learning device. The machine learning device is configured to receive the microwave scattering data, patient information, and imaging modality data corresponding to at least one of a presence of disease, absence of disease, or one or more disease features; analyze the microwave scattering data, patient information, and imaging modality data; output at least one of a predicted disease state and predicted features based on the analyzed microwave scattering data, patient information, and imaging modality data; compare the imaging modality data corresponding to the at least one of a presence of disease, absence of disease, or one or more disease features to the predicted disease state or predicted features; and use the comparison as an input into the machine learning device.
Public/Granted literature
- US20210335493A1 SYSTEM TO DETECT DIELECTRIC CHANGES IN MATTER Public/Granted day:2021-10-28
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