Invention Grant
- Patent Title: Contact window structure, metal plug and forming method thereof, and semiconductor structure
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Application No.: US17401461Application Date: 2021-08-13
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Publication No.: US12002748B2Publication Date: 2024-06-04
- Inventor: Jie Liu , Ping-Heng Wu , Zhan Ying
- Applicant: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Applicant Address: CN Hefei
- Assignee: Changxin Memory Technologies, Inc.
- Current Assignee: Changxin Memory Technologies, Inc.
- Current Assignee Address: CN Hefei
- Agency: Cooper Legal Group, LLC
- Priority: CN 2011001855.8 2020.09.22
- Main IPC: H01L23/522
- IPC: H01L23/522 ; H01L21/768 ; H01L23/528 ; H01L23/532

Abstract:
A contact window structure, a metal plug and a forming method thereof, a method of forming the contact window structure and a semiconductor structure are provided. In the method of forming the contact window, an annular pad is formed on a surface of a target layer. A central via, from which partial surface of the target layer is exposed, is formed in the middle part of the annular pad. A dielectric layer covering a substrate, the target layer and the annular pad is formed. The dielectric layer is etched to form an etch hole connected to the central via in the dielectric layer. The annular pad is removed along the etch hole and the central via to enlarge a size of the central via, so as to form the contact window structure by the etch hole and the central via with the enlarged size.
Public/Granted literature
- US20220093509A1 CONTACT WINDOW STRUCTURE, METAL PLUG AND FORMING METHOD THEREOF, AND SEMICONDUCTOR STRUCTURE Public/Granted day:2022-03-24
Information query
IPC分类: