Invention Grant
- Patent Title: Delay measurement device, delay measurement method, and delay measurement program
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Application No.: US18022699Application Date: 2020-08-24
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Publication No.: US12003397B2Publication Date: 2024-06-04
- Inventor: Satoshi Nakatsukasa , Toshihiro Yokoi , Ken Takahashi
- Applicant: Nippon Telegraph and Telephone Corporation
- Applicant Address: JP Tokyo
- Assignee: Nippon Telegraph and Telephone Corporation
- Current Assignee: Nippon Telegraph and Telephone Corporation
- Current Assignee Address: JP Tokyo
- Agency: Fish & Richardson P.C.
- International Application: PCT/JP2020/031809 2020.08.24
- International Announcement: WO2022/044069A 2022.03.03
- Date entered country: 2023-02-22
- Main IPC: H04L43/0852
- IPC: H04L43/0852 ; H04L45/302

Abstract:
A delay measurement device measures a delay time of an end-to-end route path of a virtual private network related to a predetermined user. The delay measurement device includes a measurement route generation unit configured to generate a first route that transfers to a start point node of a route path, transfers back on the route path, and then returns to itself, and to generate a second route of a route that transfers to the start point node of the route path and returns to itself; a packet transmission/reception unit configured to transmit and receive packets circulating on the first route; a delay measurement unit configured to measure a time from transmission of the packet to reception of the packet to set the measured time as a delay time of the route; and a one-way delay calculation unit configured to calculate a one-way delay time of the route path.
Public/Granted literature
- US20230318955A1 DELAY MEASUREMENT DEVICE, DELAY MEASUREMENT METHOD, AND DELAY MEASUREMENT PROGRAM Public/Granted day:2023-10-05
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