- Patent Title: Magnetic tunnel junction element and magnetoresistive memory device
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Application No.: US17498023Application Date: 2021-10-11
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Publication No.: US12004355B2Publication Date: 2024-06-04
- Inventor: Yoshiaki Sonobe , Hideto Yanagihara
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: HARNESS, DICKEY & PIERCE, P.L.C.
- Priority: JP 20178331 2020.10.23 KR 20200173582 2020.12.11
- Main IPC: H10B61/00
- IPC: H10B61/00 ; H01F10/32 ; H10N50/10 ; H10N50/80 ; H10N50/85

Abstract:
Provided is a magnetic tunnel junction element and a magnetoresistive memory device. The magnetic tunnel junction element includes a fixed layer maintaining a magnetization direction, an insulating layer, a free layer having a variable magnetization direction, and an antiferromagnetic oxide layer. The fixed layer, the free layer, and the antiferromagnetic oxide layer may be sequentially stacked. The free layer and the antiferromagnetic oxide layer may be in direct contact with each other.
Public/Granted literature
- US20220130901A1 MAGNETIC TUNNEL JUNCTION ELEMENT AND MAGNETORESISTIVE MEMORY DEVICE Public/Granted day:2022-04-28
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