Invention Grant
- Patent Title: Method and apparatus for qubit error detection
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Application No.: US17434163Application Date: 2020-02-13
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Publication No.: US12008437B2Publication Date: 2024-06-11
- Inventor: Veit Langrock , David Divincenzo
- Applicant: Forschungszentrum Jülich GmbH
- Applicant Address: DE Jülich
- Assignee: Forschungszentrum Jülich GmbH
- Current Assignee: Forschungszentrum Jülich GmbH
- Current Assignee Address: DE
- Agency: Dickinson Wright PLLC
- Priority: DE 2019202661.3 2019.02.27
- International Application: PCT/EP2020/053735 2020.02.13
- International Announcement: WO2020/173714A 2020.09.03
- Date entered country: 2021-08-26
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/30 ; G06N10/70 ; G08C25/00 ; H03M13/00 ; H04L1/00

Abstract:
The invention relates to a method and an apparatus for detecting a state of a data qubit by means of a parity qubit, wherein both the data qubit and the parity qubit can be moved by a moving means, wherein the distance between the data qubit and the parity qubit is so large that the parity qubit cannot query the state of the data qubit, wherein the distance between the data qubit and the parity qubit is reduced by moving the data qubit along a first path and the parity qubit along a second path until the state of the data qubit can be queried by the parity qubit, characterized in that the first path is longer than the second path and/or that the speed of movement of the parity qubit is greater than the speed of movement of the data qubit.
Public/Granted literature
- US20220172097A1 METHOD AND APPARATUS FOR QUBIT ERROR DETECTION Public/Granted day:2022-06-02
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