Invention Grant
- Patent Title: Thin film, in-situ measurement through transparent crystal and transparent substrate within processing chamber wall
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Application No.: US16946263Application Date: 2020-06-12
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Publication No.: US12009191B2Publication Date: 2024-06-11
- Inventor: Patrick Tae , Blake W. Erickson , Zhaozhao Zhu , Michael David Willwerth , Barry Paul Craver
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Lowenstein Sandler LLP
- Main IPC: H01J37/32
- IPC: H01J37/32 ; G01B11/06 ; H01L21/66

Abstract:
A system includes a transparent crystal, at least part of which is embedded within a wall and a liner of a processing chamber. The transparent crystal has a proximal end and a distal end, the distal end having a distal surface exposed to an interior of the processing chamber. A transparent thin film is deposited on the distal surface and has chemical properties substantially matching those of the liner. A light coupling device is to: transmit light, from a light source, through the proximal end of the transparent crystal, and focus, into a spectrometer, light received reflected back from a combination of the distal surface, a surface of the transparent thin film, and a surface of a process film layer deposited on the transparent thin film. The spectrometer is to detect a first spectrum within the focused light that is representative of the process film layer.
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