Invention Grant
- Patent Title: Semiconductor device and fabrication method for semiconductor device
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Application No.: US18352285Application Date: 2023-07-14
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Publication No.: US12009268B2Publication Date: 2024-06-11
- Inventor: Motoyoshi Kubouchi , Kosuke Yoshida , Soichi Yoshida , Koh Yoshikawa , Nao Suganuma
- Applicant: FUJI ELECTRIC CO., LTD.
- Applicant Address: JP Kanagawa
- Assignee: FUJI ELECTRIC CO., LTD.
- Current Assignee: FUJI ELECTRIC CO., LTD.
- Current Assignee Address: JP Kanagawa
- Priority: JP 19111761 2019.06.17 JP 20006044 2020.01.17 JP 20087040 2020.05.18
- The original application number of the division: US16899523 2020.06.11
- Main IPC: H01L29/739
- IPC: H01L29/739 ; H01L21/22 ; H01L21/265 ; H01L21/324 ; H01L21/66 ; H01L27/06 ; H01L29/06 ; H01L29/10 ; H01L29/32 ; H01L29/40 ; H01L29/861

Abstract:
A semiconductor device includes trench portions arrayed in a first direction on an upper surface side of a semiconductor substrate, a first conductivity type lower surface region provided in a part of a lower surface of the semiconductor substrate, a second conductivity type base region provided on the upper surface side, a first conductivity type first region disposed between the base region and the lower surface region, a first conductivity type upper surface region provided on an upper surface of the semiconductor substrate, and a second conductivity type bottom region disposed continuously in the first direction to be in contact with bottom portions of the trench portions. In a cross section along the first direction and perpendicular to the upper and lower surfaces and passing through the lower surface region, one end portion of the bottom region in the first direction locates directly above the lower surface region.
Public/Granted literature
- US20230369137A1 SEMICONDUCTOR DEVICE AND FABRICATION METHOD FOR SEMICONDUCTOR DEVICE Public/Granted day:2023-11-16
Information query
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