Invention Grant
- Patent Title: Product inspection method and product inspection apparatus
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Application No.: US17598401Application Date: 2020-03-25
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Publication No.: US12013347B2Publication Date: 2024-06-18
- Inventor: Go Yamada , Aya Ota , Koji Nakayama
- Applicant: Ushio Denki Kabushiki Kaisha , TOWA PHARMACEUTICAL CO., LTD.
- Applicant Address: JP Tokyo
- Assignee: USHIO DENKI KABUSHIKI KAISHA,TOWA PHARMACEUTICAL CO., LTD.
- Current Assignee: USHIO DENKI KABUSHIKI KAISHA,TOWA PHARMACEUTICAL CO., LTD.
- Current Assignee Address: JP Tokyo; JP Kadoma
- Agency: BUCHANAN INGERSOLL & ROONEY PC
- Priority: JP 19061998 2019.03.27
- International Application: PCT/JP2020/013499 2020.03.25
- International Announcement: WO2020/196690A 2020.10.01
- Date entered country: 2021-09-27
- Main IPC: G01N21/95
- IPC: G01N21/95 ; G01N21/88 ; G01N21/956

Abstract:
Super continuum light having a continuous spectrum over at least 1100 to 1300 nm is emitted from a pulsed light source, is pulse-stretched by a stretching element such that a relationship between a wavelength and an elapsed time in one pulse is one to one, and is radiated to a product. The light transmitted through the product is received by a light receiver, and output data is input to the determination unit. A quality determination program of the determination unit calculates an absorption spectrum from the output data, quantifies the absorption spectrum by chemometrics, and compares the absorption spectrum with a reference value to determine quality. The product determined to be a defective product is excluded by an exclusion mechanism.
Public/Granted literature
- US20220178848A1 PRODUCT INSPECTION METHOD AND PRODUCT INSPECTION APPARATUS Public/Granted day:2022-06-09
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