Invention Grant
- Patent Title: Abnormality detection system, abnormality detection apparatus, and abnormality detection method
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Application No.: US16850806Application Date: 2020-04-16
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Publication No.: US12013679B2Publication Date: 2024-06-18
- Inventor: Shinji Ishikawa
- Applicant: RENESAS ELECTRONICS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: RENESAS ELECTRONICS CORPORATION
- Current Assignee: RENESAS ELECTRONICS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Rimon P.C.
- Priority: JP 19111283 2019.06.14
- Main IPC: G05B19/406
- IPC: G05B19/406 ; G06F17/18

Abstract:
It is an object of the present invention to provide a technique capable of easily extracting a section signal of a specific sub-process. The anomaly detection system includes an extraction unit for extracting a specific subsequence to be an object of anomaly detection from among a plurality of subsequences from a composite sequence included in a monitor signal. The extraction unit determines an optimal warping path from the composite sequence and a reference sequence, which is an example of the composite sequence acquired in advance, by a dynamic time warping method. The extraction unit identifies a start point and an end point of a specific subsequence based on the optimal warping path and the start point and end point of the subsequence of the reference sequence. The extraction unit extracts a specific subsequence based on a start point and an end point of the specific subsequence.
Information query
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