Invention Grant
- Patent Title: Method and device for evaluating quality of pathological slide image
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Application No.: US18321132Application Date: 2023-05-22
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Publication No.: US12014502B2Publication Date: 2024-06-18
- Inventor: Ga Hee Park , Kyung Hyun Paeng , Chan Young Ock , Sang Hoon Song , Suk Jun Kim
- Applicant: Lunit Inc.
- Applicant Address: KR Seoul
- Assignee: Lunit Inc.
- Current Assignee: Lunit Inc.
- Current Assignee Address: KR Seoul
- Agency: Sughrue Mion, PLLC
- Priority: KR 20220063320 2022.05.24 KR 20230038276 2023.03.23
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G06V20/69 ; G16H15/00 ; G16H30/40
Abstract:
A computing device includes at least one memory, and at least one processor configured to analyze at least one object expressed in a pathological slide image, evaluate quality of the pathological slide image based on a result of the analyzing, and perform at least one additional operation according to a result of the evaluating.
Public/Granted literature
- US20230386028A1 METHOD AND DEVICE FOR EVALUATING QUALITY OF PATHOLOGICAL SLIDE IMAGE Public/Granted day:2023-11-30
Information query
