Invention Grant
- Patent Title: Image recognition device and method
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Application No.: US17286604Application Date: 2018-12-21
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Publication No.: US12014530B2Publication Date: 2024-06-18
- Inventor: Ryou Yumiba , Yasutaka Toyoda , Hiroyuki Shindo
- Applicant: HITACHI HIGH-TECH CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: MATTINGLY & MALUR, PC
- International Application: PCT/JP2018/047224 2018.12.21
- International Announcement: WO2020/129235A 2020.06.25
- Date entered country: 2021-04-19
- Main IPC: G06V10/44
- IPC: G06V10/44 ; G06F18/20 ; G06F18/2113 ; G06F18/213 ; G06N20/00 ; G06V10/77 ; G06V10/82 ; G06V20/69

Abstract:
In order to select an optimal learning model for an image when inference is carried out in the extraction of a profile line using machine learning, without requiring a correct value or degree of certainty, a feature extraction learning model group containing a plurality of learning models is used for feature extraction. A recall learning model group containing recall learning models is paired with the feature extraction learning models. A feature amount extraction unit for referencing a feature extraction learning model and extracting a feature amount from input data; a data-to-data recall unit for referencing a recall learning model and outputting a recall result with the feature amount subjected to dimensional compression; and a learning model selection unit for selecting a feature extraction learning model from the feature extraction learning model group under the condition that the difference between the feature amount and the recall result is minimized are provided.
Public/Granted literature
- US20210374403A1 IMAGE RECOGNITION DEVICE AND METHOD Public/Granted day:2021-12-02
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