Invention Grant
- Patent Title: Plasma enhanced wafer soak for thin film deposition
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Application No.: US17309014Application Date: 2019-10-02
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Publication No.: US12014921B2Publication Date: 2024-06-18
- Inventor: Arul N. Dhas , Ming Li , Tu Hong
- Applicant: Lam Research Corporation
- Applicant Address: US CA Fremont
- Assignee: Lam Research Corporation
- Current Assignee: Lam Research Corporation
- Current Assignee Address: US CA Fremont
- Agency: Weaver Austin Villeneuve & Sampson LLP
- International Application: PCT/US2019/054226 2019.10.02
- International Announcement: WO2020/081235A 2020.04.23
- Date entered country: 2021-04-13
- Main IPC: H01L21/02
- IPC: H01L21/02 ; C23C16/455 ; H01L21/67

Abstract:
Disclosed are apparatuses and methods for providing a substrate onto a substrate support in a processing chamber, generating an inert plasma in the processing chamber, and maintaining the inert plasma to heat the substrate to a steady state temperature, suitable for conducting plasma-enhanced chemical vapor deposition (PECVD), in less than 30 seconds from providing the substrate onto the substrate support. An apparatus may include a processing chamber, a process station that includes a substrate support, a process gas unit configured to flow an inert gas onto a substrate supported by the substrate support, a plasma source configured to generate an inert plasma in the process station, and a controller with instructions configured to flow the inert gas onto the substrate, generate the inert plasma in the first process station, and maintain the inert plasma to thereby heat the substrate.
Public/Granted literature
- US20210366705A1 PLASMA ENHANCED WAFER SOAK FOR THIN FILM DEPOSITION Public/Granted day:2021-11-25
Information query
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