Invention Grant
- Patent Title: Method for calibrating CNC processing apparatus
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Application No.: US17598823Application Date: 2020-03-16
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Publication No.: US12025428B2Publication Date: 2024-07-02
- Inventor: Masahiro Suzuki , Satoshi Suzuki , Andreas Hieble
- Applicant: HEXAGON METROLOGY KABUSHIKI KAISHA
- Applicant Address: JP Sagamihara
- Assignee: HEXAGON METROLOGY KABUSHIKI KAISHA
- Current Assignee: HEXAGON METROLOGY KABUSHIKI KAISHA
- Current Assignee Address: JP Sagamihara
- Agency: Maschoff Brennan
- Priority: JP 19063455 2019.03.28
- International Application: PCT/JP2020/011564 2020.03.16
- International Announcement: WO2020/196063A 2020.10.01
- Date entered country: 2021-09-27
- Main IPC: G01B11/24
- IPC: G01B11/24 ; G01B5/008 ; G01B11/00 ; G01B21/04 ; G05B19/401

Abstract:
A method for calibrating a CNC processing apparatus is provided that can significantly reduce the amount of operation time required for sensor calibration. A method of the present invention for calibrating a non-contact sensor in a CNC processing apparatus 1 includes a first step, a second step and a third step. In the first step, the center coordinates of a reference instrument are measured with a contact probe and thereby the machine coordinates of the center of the reference instrument are determined. In the second step, after a non-contact sensor 110 is mounted onto a spindle 26, the center coordinates of the reference instrument are measured only one time with the non-contact sensor 110, and thereby the non-contact sensor coordinates of the center of the reference instrument are determined. In the third step, calculations are made to determine the amount of displacement required to bring the non-contact sensor coordinates obtained in the second step into agreement with the machine coordinates obtained with the contact probe in the first step.
Public/Granted literature
- US20220178679A1 METHOD FOR CALIBRATING CNC PROCESSING APPARATUS Public/Granted day:2022-06-09
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