Invention Grant
- Patent Title: Measuring device
-
Application No.: US17761718Application Date: 2020-07-14
-
Publication No.: US12025474B2Publication Date: 2024-07-02
- Inventor: Daniel Auer , Christoph Heinemann , Marc Oliver Tiemann
- Applicant: DR. JOHANNES HEIDENHAIN GmbH
- Applicant Address: DE Traunreut
- Assignee: DR. JOHANNES HEIDENHAIN GMBH
- Current Assignee: DR. JOHANNES HEIDENHAIN GMBH
- Current Assignee Address: DE Traunreut
- Agency: Carter, DeLuca & Farrell LLP
- Priority: DE 2019214219.2 2019.09.18
- International Application: PCT/EP2020/069819 2020.07.14
- International Announcement: WO2021/052651A 2021.03.25
- Date entered country: 2022-03-18
- Main IPC: G01D5/20
- IPC: G01D5/20 ; G01L3/14

Abstract:
A measuring device includes first and second component groups rotatable about an axis relative to each other. The first component group has a scanning component, having a first substrate, and the second component group has a scale component, having a second substrate and an angle scale. The measuring device can determine a relative angular position between the component groups. The measuring device has a passive sensor array having conductor track structures. The conductor track structures are applied on the first substrate by an additive process so that the sensor array determines a torsional load of the first substrate about the axis. Alternatively, the conductor track structures are applied on the second substrate by an additive process so that the sensor array determines a torsional load of the second substrate about the axis.
Public/Granted literature
- US20220341757A1 MEASURING DEVICE Public/Granted day:2022-10-27
Information query
IPC分类: