Invention Grant
- Patent Title: System of performing boundary scan test on pin through test point and method thereof
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Application No.: US17948703Application Date: 2022-09-20
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Publication No.: US12025660B2Publication Date: 2024-07-02
- Inventor: Qiu-Yue Duan , Xin-Ying Xie , Ben Han
- Applicant: Inventec (Pudong) Technology Corporation
- Applicant Address: CN Shanghai
- Assignee: Inventec (Pudong) Technology Corporation,Inventec Corporation
- Current Assignee: Inventec (Pudong) Technology Corporation,Inventec Corporation
- Current Assignee Address: CN Shanghai; TW Taipei
- Agency: Stevens Law Group
- Agent David R. Stevens
- Priority: CN 2211078524.3 2022.09.05
- Main IPC: G01R31/3185
- IPC: G01R31/3185 ; G01R31/28

Abstract:
A system of performing boundary scan test on pin through test point and a method thereof are disclosed. When an under-test pin of a target connector is determined to be unable to perform a boundary scan test, a test point connected to and closest to the under-test pin is searched, a test signal is transmitted to a target connector, a result signal from the target connector in response to the test signal is received, an expected result and the result signal are compared to generate a test result, so that a boundary scan function can be applied to test a connector of a computer product, to achieve the technical effect of providing a better test range and a better test coverage to improve test efficiency and reduce test cost, compared to conventional boundary scan test.
Public/Granted literature
- US20240094292A1 System of Performing Boundary Scan Test on Pin Through Test Point and Method Thereof Public/Granted day:2024-03-21
Information query
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