Invention Grant
- Patent Title: Method for calculating sensitivity of displacement of SAR along line-of-sight direction to slope gradient and slope aspect
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Application No.: US17839929Application Date: 2022-06-14
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Publication No.: US12025694B2Publication Date: 2024-07-02
- Inventor: Xianlin Shi , Keren Dai , Jin Deng
- Applicant: Chengdu University of Technology
- Applicant Address: CN Chengdu
- Assignee: CHENGDU UNIVERSITY OF TECHNOLOGY
- Current Assignee: CHENGDU UNIVERSITY OF TECHNOLOGY
- Current Assignee Address: CN Chengdu
- Agency: Miller, Canfield, Paddock and Stone
- Agent Gregory D. DeGrazia
- Priority: CN 2111084210.X 2021.09.16
- Main IPC: G01S13/90
- IPC: G01S13/90 ; G01C5/00 ; G01S13/88

Abstract:
A method for calculating a sensitivity of a displacement of Synthetic Aperture Radar (SAR) along line-of-sight direction to a slope gradient and a slope aspect is provided, comprising: obtaining SAR data and Digital Elevation Model (DEM) data covering slope bodies, and extracting a local incident angle of an image by utilizing a satellite side-looking imaging principle; carrying out geometric distortion on the slope bodies under ascending and descending orbits by utilizing the local incident angle, to obtain specific locations of geometric distortion areas under ascending and descending orbit; calculating sensitivities of detections to changes of the slope gradient and the slope aspect under ascending and descending orbits according to the extracted parameter information of the SAR satellite in ascending and descending orbits and satellite heights, and dividing a sensitivity distribution by combining the sensitivity and the specific locations of the geometric distortion.
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