- Patent Title: Object specific measuring with an opto-electronic measuring device
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Application No.: US17113168Application Date: 2020-12-07
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Publication No.: US12025736B2Publication Date: 2024-07-02
- Inventor: Thomas Piok , Jürg Hinderling
- Applicant: HEXAGON TECHNOLOGY CENTER GMBH
- Applicant Address: CH Heerbrugg
- Assignee: HEXAGON TECHNOLOGY CENTER GMBH
- Current Assignee: HEXAGON TECHNOLOGY CENTER GMBH
- Current Assignee Address: CH Heerbrugg
- Agency: Maschoff Brennan
- Priority: EP 216635 2019.12.16
- Main IPC: G01C3/08
- IPC: G01C3/08 ; G01S7/48 ; G01S7/481 ; G01S17/10 ; G01S17/89

Abstract:
A method for controlling an opto-electronic measuring device for radiation based object point measuring such as a laser tracker, laser scanner, multi beam scanner, laser profiler, scanning total station, flash lidar, airborne scanning lidar or scanning multi station. The power of the emitted measurement radiation is object individually automatically varied specific for a direction and distance to respective objects whereby the power is adjusted in such a way that it does not exceed a predefined distance dependent power limit applying to the respective object distance precisely when the measurement radiation is emitted in the respective object direction.
Public/Granted literature
- US20210181346A1 OBJECT SPECIFIC MEASURING WITH AN OPTO-ELECTRONIC MEASURING DEVICE Public/Granted day:2021-06-17
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