Invention Grant
- Patent Title: Interconnection structure and method of manufacturing the same, and electronic device including the interconnection structure
-
Application No.: US17836934Application Date: 2022-06-09
-
Publication No.: US12027457B2Publication Date: 2024-07-02
- Inventor: Huilong Zhu
- Applicant: INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OF SCIENCES
- Applicant Address: CN Beijing
- Assignee: INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OF SCIENCES
- Current Assignee: INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OF SCIENCES
- Current Assignee Address: CN Beijing
- Agency: Haynes and Boone, LLP
- Priority: CN 1810149531.5 2018.02.13
- Main IPC: H01L23/522
- IPC: H01L23/522 ; H01L21/768 ; H01L23/532

Abstract:
An interconnection structure and a method of manufacturing the same, and an electronic device including the interconnection structure are provided. According to an embodiment, the interconnection structure includes: a first interconnection line at a first level, including at least a first portion extending along a first direction; a second interconnection line at a second level higher than the first level, including at least a second portion extending along a second direction crossing the first direction; a via plug disposed between the first portion of the first interconnection line and the second portion of the second interconnection line, and configured to electrically connect the first interconnection line and the second interconnection line, wherein the via plug includes a first pair of sidewalls respectively extending substantially parallel to corresponding sidewalls of the first portion and a second pair of sidewalls respectively extending substantially parallel to corresponding sidewalls of the second portion.
Public/Granted literature
Information query
IPC分类: