Invention Grant
- Patent Title: Method of manufacturing semiconductor structure and semiconductor structure
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Application No.: US17453046Application Date: 2021-11-01
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Publication No.: US12029026B2Publication Date: 2024-07-02
- Inventor: Xiaoling Wang , Hai-Han Hung
- Applicant: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Applicant Address: CN Hefei
- Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee Address: CN Hefei
- Agency: Kilpatrick Townsend & Stockton LLP
- Priority: CN 2110926432.5 2021.08.12
- Main IPC: H01L27/108
- IPC: H01L27/108 ; H01L29/78 ; H01L29/786 ; H10B12/00

Abstract:
The present disclosure provides a method of manufacturing a semiconductor structure and a semiconductor structure, relating to the technical field of semiconductors. The method of manufacturing a semiconductor structure includes: providing a substrate; forming active pillars arranged in an array on the substrate, a projection shape of a longitudinal section of each of the active pillars includes a cross shape; forming a first oxide layer on the substrate, where a filling region is formed between adjacent active pillars in the same row; sequentially forming a word line and a dielectric layer in the filling region; exposing a top surface of each of the active pillars; forming a contact layer on the active pillars; and forming a capacitor structure on the contact layer.
Public/Granted literature
- US20230049203A1 METHOD OF MANUFACTURING SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR STRUCTURE Public/Granted day:2023-02-16
Information query
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