Invention Grant
- Patent Title: Semiconductor structure and forming method thereof
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Application No.: US17647658Application Date: 2022-01-11
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Publication No.: US12029047B2Publication Date: 2024-07-02
- Inventor: Yiming Zhu , Xiaoguang Wang
- Applicant: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Applicant Address: CN Hefei
- Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee Address: CN Hefei
- Agency: Kilpatrick Townsend & Stockton LLP
- Priority: CN 2011596138.4 2020.12.29
- Main IPC: H10B61/00
- IPC: H10B61/00 ; H10B12/00 ; H10B63/00 ; H10N50/01 ; H10N50/80 ; H10N70/20

Abstract:
The present application relates to a semiconductor structure and its forming method. The semiconductor structure comprises a substrate; a first transistor, including a first channel region disposed within the substrate, and a first end disposed at surface of the substrate, the first end being adapted to connect with a first-type storage cell; and a second transistor, including a second channel region disposed within the substrate, and a second end disposed at surface of the substrate, the second end being adapted to connect with a second-type storage cell, the first channel region and the second channel region having different areas.
Public/Granted literature
- US20220208855A1 Semiconductor Structure and Forming Method thereof Public/Granted day:2022-06-30
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