Invention Grant
- Patent Title: Method of testing display device
-
Application No.: US18082187Application Date: 2022-12-15
-
Publication No.: US12033550B2Publication Date: 2024-07-09
- Inventor: Ahnho Jee , Heebum Park , Sang-Woo Park , Keunhyuk Youn , Sungho Cho
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Yongin-si
- Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee Address: KR Gyeonggi-Do
- Agency: CANTOR COLBURN LLP
- Priority: KR 20220037942 2022.03.28
- Main IPC: G09G3/00
- IPC: G09G3/00
Abstract:
A method of testing a display device including a display panel which displays an image and a driver which drives the display panel including measuring a driving operating current in a state where the driver is enabled and the display panel is disabled, and determining whether the driver is defective, based on the driving operating current and measuring a display operating current in a state where the driver and the display panel are enabled, and determining whether the display panel is defective, based on the display operating current.
Public/Granted literature
- US20230316965A1 METHOD OF TESTING DISPLAY DEVICE Public/Granted day:2023-10-05
Information query
