Invention Grant
- Patent Title: Method for improving efficiency of defect detection in images, image defect detection apparatus, and computer readable storage medium employing method
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Application No.: US17584736Application Date: 2022-01-26
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Publication No.: US12039710B2Publication Date: 2024-07-16
- Inventor: Chin-Pin Kuo , Tung-Tso Tsai , Shih-Chao Chien
- Applicant: HON HAI PRECISION INDUSTRY CO., LTD.
- Applicant Address: TW New Taipei
- Assignee: HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee: HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee Address: TW New Taipei
- Agency: ScienBiziP, P.C.
- Priority: CN 2110164687.2 2021.02.05
- Main IPC: H03M7/30
- IPC: H03M7/30 ; G06T7/00 ; G06V10/77

Abstract:
A method of detecting defects revealed in images of products obtains sample image training data. An underlying feature dimension of an autoencoder is selected and a score is obtained. By comparing the score with a standard score, an optimal underlying feature dimension is confirmed. A test image is inputted into the autoencoder with the optimal underlying feature dimension to obtain a reconstruction image. A reconstruction error between the test image and the reconstruction image is computed. By comparing the reconstruction error with the predefined threshold a result of analysis of the test image is outputted. An image defect detection apparatus and a computer readable storage medium applying the method are also provided.
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