Invention Grant
- Patent Title: Probes for electrical testing in defect detection systems
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Application No.: US17947765Application Date: 2022-09-19
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Publication No.: US12044727B2Publication Date: 2024-07-23
- Inventor: Tal Goichman , Dmitri Burshtyn , Ashkan Aghajani
- Applicant: Orbotech Ltd.
- Applicant Address: IL Yavne
- Assignee: Orbotech Ltd.
- Current Assignee: Orbotech Ltd.
- Current Assignee Address: IL Yavne
- Agency: Hodgson Russ LLP
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
A fine electrical probe can provide fine-pitch applications in devices such as smart watches and smart phones. Fingers are positioned on a substrate. The substrate has a recess that allows the fingers to flex. The substrate and fingers are positioned in an assembly. The assembly has a recess that allows the substrate to flex.
Public/Granted literature
- US20240094285A1 PROBES FOR ELECTRICAL TESTING IN DEFECT DETECTION SYSTEMS Public/Granted day:2024-03-21
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