Invention Grant
- Patent Title: Method for detecting defects in product and computer device
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Application No.: US17561821Application Date: 2021-12-24
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Publication No.: US12045970B2Publication Date: 2024-07-23
- Inventor: Chin-Pin Kuo , Wei-Chun Wang
- Applicant: HON HAI PRECISION INDUSTRY CO., LTD.
- Applicant Address: TW New Taipei
- Assignee: HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee: HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee Address: TW New Taipei
- Agency: ScienBiziP, P.C.
- Priority: CN 2011599668.4 2020.12.29
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G01N21/88 ; G06T7/11

Abstract:
A method for detecting defects in product applied in a computer device inputs an image of a product under test to an automatic encoder to obtain a reconstructed image, and the image is segmented into N image blocks and the reconstructed image is segmented into N image blocks. The computer device associates each of the N testing blocks with one reconstructed blocks according to positions of the N testing blocks in the image and positions of the N reconstructed blocks in the reconstructed image. The computer device further calculates mean square errors between each of the N testing blocks and each of the N reconstructed blocks, and associates each mean square error with each of the N testing blocks, whether the product has defects being determined based on the mean square errors corresponding to each of the N testing blocks.
Public/Granted literature
- US20220207706A1 METHOD FOR DETECTING DEFECTS IN PRODUCT AND COMPUTER DEVICE Public/Granted day:2022-06-30
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