Invention Grant
- Patent Title: Apparatus for inspecting a display panel for defects
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Application No.: US16512990Application Date: 2019-07-16
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Publication No.: US12046167B2Publication Date: 2024-07-23
- Inventor: Hoon Sohn , Sangwoo Choi , Minsang Koo , Sanghyuk Kwon , Eunchul Shin , Woojin Jung , Jiho Park , Soonkyu Hwang
- Applicant: Samsung Display Co., Ltd. , Korea Advanced Institute of Science and Technology
- Applicant Address: KR Yongin-Si
- Assignee: SAMSUNG DISPLAY CO., LTD.,KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
- Current Assignee: SAMSUNG DISPLAY CO., LTD.,KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
- Current Assignee Address: KR Yongin-si; KR Daejeon
- Agency: F. Chau & Associates, LLC
- Priority: KR 20180102513 2018.08.30
- Main IPC: G01N25/72
- IPC: G01N25/72 ; G01N21/17 ; G01N21/95 ; G01N21/956 ; G09G3/00

Abstract:
An apparatus for inspecting a display panel for defects includes a table which supports the display panel, a laser excitation unit that irradiates a non-display area of the display panel with a point laser beam, a thermal wave detecting unit that generates thermal wave images of irradiated portions of the non-display area, a driving unit, and a control unit. A groove corresponding to an edge of the display panel may be defined in a top surface of the table. A defect, such as a crack, may be detected by comparing a defect pattern obtained from the thermal wave images with a pre-registered defect pattern.
Public/Granted literature
- US20200074901A1 APPARATUS FOR INSPECTING A DISPLAY PANEL FOR DEFECTS Public/Granted day:2020-03-05
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