- Patent Title: DEPFET transistor and method of manufacturing a DEPFET transistor
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Application No.: US17608942Application Date: 2020-05-06
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Publication No.: US12046674B2Publication Date: 2024-07-23
- Inventor: Alexander Bähr , Peter Lechner , Jelena Ninkovic , Rainer Richter , Florian Schopper , Johannes Treis
- Applicant: Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
- Applicant Address: DE Munich
- Assignee: Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
- Current Assignee: Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.
- Current Assignee Address: DE Munich
- Agency: Locke Lord LLP
- Agent Scott D. Wofsy; Christopher J. Capelli
- Priority: DE 2019206494 2019.05.06
- International Application: PCT/EP2020/062504 2020.05.06
- International Announcement: WO2020/225275A 2020.11.12
- Date entered country: 2021-11-04
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L29/10 ; H01L29/423 ; H01L29/66 ; H01L31/113 ; H01L21/265

Abstract:
The invention relates to a DEPFET comprising: a semiconductor substrate (100) of a first conduction type, which has a first main surface (101) and a second main surface (102), which are opposite one another; a source terminal region (1s) of a second conduction type on the first main surface (101); a drain terminal region (1d) of a second conduction type; a channel region (10), which is arranged between the source terminal region (1s) and the drain terminal region (1d); a gate electrode (11), which is separated from the channel region (10) by a gate insulator (6); a rear activation region (104) of a second conduction type, which is formed on the second main surface (102); and a substrate doping increase region (2) of a first conduction type, which is formed at least under the source terminal region (1s) and under the channel region (10), the substrate doping increase region (2) having a signal charge control region (20) of the first conduction type below the gate electrode (11), in which signal charge control region the effective doping dose has a higher value than at other points of the substrate doping increase region (2) below the gate electrode.
Public/Granted literature
- US12015082B2 DEPFET transistor and method of manufacturing a DEPFET transistor Public/Granted day:2024-06-18
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