An inspection device includes a small shutter in an opening of an inspection chamber, and a large shutter behind the small shutter. The small shutter has a closed state, an inward-open state, and an outward-open state. The small shutter in the inward-open or outward-open state is pushed by a workpiece and pivots inward in or outward from the inspection chamber. The large shutter has a light-shielding state, a driven state, and a stationary state. The large shutter in the light-shielding state overlaps the small shutter in the closed state and closes a clearance between the opening and the small shutter. The large shutter in the driven state is pushed by the small shutter in the inward-open state and pivots with the small shutter. The large shutter in the stationary state is separate from the small shutter in the outward-open state and at a same position as in the light-shielding state.