Invention Grant
- Patent Title: Method for manufacturing semiconductor structure and semiconductor structure
-
Application No.: US17445400Application Date: 2021-08-18
-
Publication No.: US12051615B2Publication Date: 2024-07-30
- Inventor: Mengzhu Qiao
- Applicant: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Applicant Address: CN Hefei
- Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee Address: CN Hefei
- Agency: Syncoda LLC
- Agent Feng Ma
- Priority: CN 2010984302.2 2020.09.18
- Main IPC: H01L21/762
- IPC: H01L21/762 ; H01L21/02 ; H01L21/8234

Abstract:
A method for manufacturing a semiconductor structure includes: a substrate is provided, an isolation trench being formed on the substrate; a silicon-rich isolation layer is formed in the isolation trench, the silicon-rich isolation layer covering an inner surface of the isolation trench; and an isolation oxide layer is formed in the isolation trench. The isolation oxide layer fills up the isolation trench.
Public/Granted literature
- US20220093451A1 METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR STRUCTURE Public/Granted day:2022-03-24
Information query
IPC分类: