Invention Grant
- Patent Title: Optoelectronic sensor arrangement and optical measuring method
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Application No.: US17425596Application Date: 2020-01-29
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Publication No.: US12051758B2Publication Date: 2024-07-30
- Inventor: Luca Haiberger , Daniel Richter
- Applicant: OSRAM Opto Semiconductors GmbH
- Applicant Address: DE Regensburg
- Assignee: OSRAM Opto Semiconductors GmbH
- Current Assignee: OSRAM Opto Semiconductors GmbH
- Current Assignee Address: DE Regensburg
- Agency: Slater Matsil, LLP
- Priority: DE 2019103155.9 2019.02.08
- International Application: PCT/EP2020/052121 2020.01.29
- International Announcement: WO2020/160973A 2020.08.13
- Date entered country: 2021-07-23
- Main IPC: H01L31/0232
- IPC: H01L31/0232 ; G02B6/42 ; H01L31/173 ; H01L25/16 ; H04B10/40

Abstract:
In an embodiment an optoelectronic sensor arrangement includes a carrier substrate, an illuminating device, a frequency-selective optical element and a photodetector, wherein the illuminating device and the photodetector form a stacked arrangement on or with the carrier substrate, wherein the frequency-selective optical element is arranged between the illuminating device and the photodetector, wherein the photodetector is arranged in a cavity of the carrier substrate which is covered by the illuminating device and/or the frequency-selective optical element, and wherein the frequency-selective optical element includes a divider mirror and an optical filter.
Public/Granted literature
- US20220102562A1 Optoelectronic Sensor Arrangement and Optical Measuring Method Public/Granted day:2022-03-31
Information query
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