Invention Grant
- Patent Title: Method for determining a parameter of a processing process and processing machine
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Application No.: US17226094Application Date: 2021-04-09
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Publication No.: US12053840B2Publication Date: 2024-08-06
- Inventor: Boris Regaard , Winfried Magg
- Applicant: TRUMPF Werkzeugmaschinen GmbH + Co. KG
- Applicant Address: DE Ditzingen
- Assignee: TRUMPF WERKZEUGMASCHINEN SE + CO. KG
- Current Assignee: TRUMPF WERKZEUGMASCHINEN SE + CO. KG
- Current Assignee Address: DE Ditzingen
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: DE 2018217526.8 2018.10.12
- Main IPC: B23K26/70
- IPC: B23K26/70 ; B23K26/38

Abstract:
A method determines at least one parameter for a process quality during a processing process. The method includes: processing a workpiece while moving a processing tool and the workpiece relative to one another; monitoring a region on the workpiece; determining the at least one parameter for the process quality based on the monitored region; and determining at least one position-dependent parameter for the process quality based on a plurality of measured values of the at least one parameter at a same processing position, or determining at least one direction-dependent parameter for the process quality based on the plurality of measured values of the at least one parameter in a same processing direction.
Public/Granted literature
- US20210229220A1 METHOD FOR DETERMINING A PARAMETER OF A PROCESSING PROCESS AND PROCESSING MACHINE Public/Granted day:2021-07-29
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