- Patent Title: Strain distribution measurement system and strain distribution measurement method that measure strain distribution based on distribution of reflectance or polarization characteristic
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Application No.: US17325212Application Date: 2021-05-20
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Publication No.: US12055382B2Publication Date: 2024-08-06
- Inventor: Tomotaka Nagashima , Yukimitsu Iwanaga , Norio Hirayama
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: JCIPRNET
- Priority: JP 20089381 2020.05.22
- Main IPC: G01B11/16
- IPC: G01B11/16 ; G01N3/08
Abstract:
A strain distribution measurement system includes a tensile tester that deforms a test piece to measure mechanical properties of a material of the test piece, and a strain distribution measuring device that measures a strain distribution of the test piece. The strain distribution measuring device measures the strain distribution of the test piece based on a distribution of at least one of a reflectance or a polarization characteristic on the main face of the test piece.
Public/Granted literature
- US20210364276A1 STRAIN DISTRIBUTION MEASUREMENT SYSTEM AND STRAIN DISTRIBUTION MEASUREMENT METHOD Public/Granted day:2021-11-25
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