The present application discloses calibration system and method for an electric field probe and a magnetic field probe based on multiple components. The system includes a microstrip line calibration assembly, a clamp, a vector network analyzer and a data processing unit; two groups of microstrip lines included in the microstrip line calibration assembly can be distributed on different routing layers of the same PCB board or on independent PCB boards; the first group of microstrip lines is single microstrip lines or differential lines under common mode excitation, which are used to generate a main component Hy of a magnetic field, and the second group of microstrip lines is differential lines under differential mode excitation, which are used to generate a main component Ex of an electric field.