- Patent Title: Systems and methods for depth estimation using generative models
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Application No.: US18190760Application Date: 2023-03-27
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Publication No.: US12056886B2Publication Date: 2024-08-06
- Inventor: Kartik Venkataraman
- Applicant: Adeia Imaging LLC
- Applicant Address: US CA San Jose
- Assignee: Adeia Imaging LLC
- Current Assignee: Adeia Imaging LLC
- Current Assignee Address: US CA San Jose
- Agency: KPPB LLP
- Main IPC: G06T7/55
- IPC: G06T7/55 ; G06N3/045 ; G06T7/70

Abstract:
Systems and methods for depth estimation in accordance with embodiments of the invention are illustrated. One embodiment includes a method for estimating depth from images. The method includes steps for receiving a plurality of source images captured from a plurality of different viewpoints using a processing system configured by an image processing application, generating a target image from a target viewpoint that is different to the viewpoints of the plurality of source images based upon a set of generative model parameters using the processing system configured by the image processing application, and identifying depth information of at least one output image based on the predicted target image using the processing system configured by the image processing application.
Public/Granted literature
- US20230351623A1 Systems and Methods for Depth Estimation Using Generative Models Public/Granted day:2023-11-02
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