- Patent Title: Probe for three-dimensional coordinate measuring device, three-dimensional coordinate measuring device, three-dimensional coordinate measuring system, and three-dimensional coordinate measuring method
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Application No.: US17743503Application Date: 2022-05-13
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Publication No.: US12061076B2Publication Date: 2024-08-13
- Inventor: Yuji Miyaki , Shuji Shimonaka
- Applicant: Keyence Corporation
- Applicant Address: JP Osaka
- Assignee: KEYENCE CORPORATION
- Current Assignee: KEYENCE CORPORATION
- Current Assignee Address: JP Osaka
- Agency: Kilyk & Bowersox, P.L.L.C.
- Priority: JP 21106155 2021.06.25 JP 21193501 2021.11.29
- Main IPC: G01B11/00
- IPC: G01B11/00 ; G01B5/012

Abstract:
Provided are a probe for a three-dimensional coordinate measuring device that enable calculation of coordinates of a measurement point of a measurement target with high accuracy. The probe is used in the three-dimensional coordinate measuring device that calculates coordinates of a measurement point of a measurement target. In the probe, a plurality of markers whose image is captured by an imaging unit are held by a probe holding unit. A stylus, which is brought into contact with the measurement target to specify the measurement point, is attached to the probe holding unit. The stylus has a predetermined positional relationship with respect to the plurality of measurement markers. The probe holding unit is connected to a probe casing in a freely movable manner. A magnetic sensor that outputs a signal corresponding to a displacement amount of the probe holding unit with respect to the probe casing is provided inside the probe casing.
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