Probe for three-dimensional coordinate measuring device, three-dimensional coordinate measuring device, three-dimensional coordinate measuring system, and three-dimensional coordinate measuring method
Abstract:
Provided are a probe for a three-dimensional coordinate measuring device that enable calculation of coordinates of a measurement point of a measurement target with high accuracy. The probe is used in the three-dimensional coordinate measuring device that calculates coordinates of a measurement point of a measurement target. In the probe, a plurality of markers whose image is captured by an imaging unit are held by a probe holding unit. A stylus, which is brought into contact with the measurement target to specify the measurement point, is attached to the probe holding unit. The stylus has a predetermined positional relationship with respect to the plurality of measurement markers. The probe holding unit is connected to a probe casing in a freely movable manner. A magnetic sensor that outputs a signal corresponding to a displacement amount of the probe holding unit with respect to the probe casing is provided inside the probe casing.
Information query
Patent Agency Ranking
0/0