Invention Grant
- Patent Title: Transistor gate structures and methods of forming the same
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Application No.: US18302132Application Date: 2023-04-18
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Publication No.: US12062695B2Publication Date: 2024-08-13
- Inventor: Hsin-Yi Lee , Cheng-Lung Hung , Chi On Chui
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Slater Matsil, LLP
- Main IPC: H01L29/06
- IPC: H01L29/06 ; H01L27/092 ; H01L29/66 ; H01L29/78

Abstract:
In an embodiment, a device includes: a channel region; a gate dielectric layer on the channel region; a first work function tuning layer on the gate dielectric layer, the first work function tuning layer including a p-type work function metal; a barrier layer on the first work function tuning layer; a second work function tuning layer on the barrier layer, the second work function tuning layer including a n-type work function metal, the n-type work function metal different from the p-type work function metal; and a fill layer on the second work function tuning layer.
Public/Granted literature
- US20230261051A1 Transistor Gate Structures and Methods of Forming the Same Public/Granted day:2023-08-17
Information query
IPC分类: