- Patent Title: Analog-to-digital converter and method for calibrating the same, method for calibrating a pipelined analog-to-digital converter, receiver, base station and mobile device
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Application No.: US17754309Application Date: 2019-12-27
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Publication No.: US12063050B2Publication Date: 2024-08-13
- Inventor: Albert Molina , Kameran Azadet , Martin Clara , Matteo Camponeschi , Christian Lindholm
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: 2SPL Patent Attorneys PartG mbB
- Agent Yong Beom Hwang
- International Application: PCT/US2019/068647 2019.12.27
- International Announcement: WO2021/133403A 2021.07.01
- Date entered country: 2022-03-30
- Main IPC: H03M1/10
- IPC: H03M1/10 ; H03M1/46

Abstract:
An analog-to-digital converter comprising a plurality of sampling cells. At least one of the plurality of sampling cells comprises a capacitive element coupled to a cell output of the at least one of the plurality of sampling cells, wherein a cell output signal is provided at the cell output. The at least one of the plurality of sampling cells further comprises a first cell input for receiving an input signal to be digitized, and a second cell input for receiving a calibration signal. Additionally, the at least one of the plurality of sampling cells comprises a first switch circuit capable of selectively coupling the first cell input to the capacitive element based on a clock signal, and a second switch circuit capable of selectively coupling the second cell input to the capacitive element, wherein a size of the second switch circuit is smaller than a size of the first switch circuit.
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