Invention Grant
- Patent Title: Memory read-write circuit, method for controlling memory, and electronic device
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Application No.: US17660554Application Date: 2022-04-25
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Publication No.: US12073874B2Publication Date: 2024-08-27
- Inventor: Yinchuan Gu
- Applicant: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Applicant Address: CN Hefei
- Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee Address: CN Hefei
- Agency: Syncoda LLC
- Agent Feng Ma
- Priority: CN 2111295395.9 2021.11.03
- Main IPC: G11C11/4096
- IPC: G11C11/4096 ; G11C11/406 ; G11C11/4076 ; G11C11/4091 ; G11C11/4094

Abstract:
A memory read-write circuit includes a sense amplifier and a control signal generation module. A power voltage of the sense amplifier is controlled and supplied by a first control signal or a second control signal, and a first power voltage controlled and supplied by the first control signal is greater than a second power voltage controlled and supplied by the second control signal. A control signal generation module is configured to control, in a normal read-write mode, a pulse duration for generating the first control signal to be a first duration, and control, in a refresh mode, the pulse duration for generating the first control signal to be a second duration, the second duration being less than the first duration.
Public/Granted literature
- US20230139664A1 MEMORY READ-WRITE CIRCUIT, METHOD FOR CONTROLLING MEMORY, AND ELECTRONIC DEVICE Public/Granted day:2023-05-04
Information query
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