Invention Grant
- Patent Title: Method for manufacturing semiconductor device
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Application No.: US17815242Application Date: 2022-07-27
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Publication No.: US12074110B2Publication Date: 2024-08-27
- Inventor: Ching-Kai Shen , Yi-Chuan Teng , Wei-Chu Lin , Hung-Wei Liang , Jung-Kuo Tu
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT LAW
- Agent Anthony King
- The original application number of the division: US16426543 2019.05.30
- Main IPC: H01L23/532
- IPC: H01L23/532 ; H01L21/768 ; H01L23/31 ; H01L23/34 ; H01L23/48

Abstract:
A method for forming a semiconductor device includes receiving a first bonded to a second substrate by a dielectric layer, wherein a conductive layer is disposed in the dielectric layer and a cavity is formed between the first substrate, the second substrate and the dielectric layer; forming a via opening in the second substrate to expose the conductive layer and a vent hole in the substrate to couple to the cavity; forming a first buffer layer covering sidewalls of the via opening and a second buffer layer covering sidewalls of the vent hole; and forming a connecting structure in the via opening and a sealing structure to seal the vent hole.
Public/Granted literature
- US20220367378A1 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE Public/Granted day:2022-11-17
Information query
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