Invention Grant
- Patent Title: Method and device for measuring biometric information in electronic device
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Application No.: US17040709Application Date: 2019-04-05
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Publication No.: US12076169B2Publication Date: 2024-09-03
- Inventor: Jongin Park , Hwan Shim , Hongji Lee , Taehan Jeon
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Nixon & Vanderhye, P.C.
- Priority: KR 20180040198 2018.04.06
- International Application: PCT/KR2019/004098 2019.04.05
- International Announcement: WO2019/194651A 2019.10.10
- Date entered country: 2020-09-23
- Main IPC: A61B5/00
- IPC: A61B5/00 ; G06F18/25 ; G06V40/10 ; G06V40/50

Abstract:
Disclosed in various embodiments of the present invention are a method and a device for measuring a user's biometric information in an electronic device and providing information related to the biometric information. An electronic device according to various embodiments of the present invention comprises a sensor module, a camera module, a display device, and a processor, wherein the processor can be configured to: execute an application; acquire a user's first biometric information on the basis of the sensor module while the operation relating to the application is performed; estimate a user's health information at least one the basis of the first biometric information, and link the health information with the operation relating to the application so as to display same through the display device. Various embodiments are possible.
Public/Granted literature
- US20210012130A1 METHOD AND DEVICE FOR MEASURING BIOMETRIC INFORMATION IN ELECTRONIC DEVICE Public/Granted day:2021-01-14
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