Invention Grant
- Patent Title: Specimen processing apparatus, specimen measurement system and method for processing specimen
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Application No.: US16998040Application Date: 2020-08-20
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Publication No.: US12076724B2Publication Date: 2024-09-03
- Inventor: Kazuhiro Yamada , Kazuki Asao , Keisuke Kuwano
- Applicant: SYSMEX CORPORATION
- Applicant Address: JP Kobe
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe
- Agency: METROLEX IP LAW GROUP, PLLC
- Agent Robert L. Scott, Esq
- Priority: JP 19153282 2019.08.23
- Main IPC: B01L3/00
- IPC: B01L3/00 ; B01L9/06 ; G01N21/01 ; G01N21/64 ; G01N21/85 ; G01N33/49

Abstract:
A specimen processing apparatus performs processing on a specimen contained in a container. The specimen processing apparatus includes: holders having different shapes, each of the holders being configured to hold the container; a holder placement unit that comprises holder receiving portions having different shapes, the shapes of the holder receiving portions corresponding to the shapes of the holders; and a specimen processing unit that performs processing on the specimen contained in the container held by one of the holders placed on the holder placement unit.
Public/Granted literature
- US20210053050A1 SPECIMEN PROCESSING APPARATUS, SPECIMEN MEASUREMENT SYSTEM AND METHOD FOR PROCESSING SPECIMEN Public/Granted day:2021-02-25
Information query
IPC分类: