Invention Grant
- Patent Title: Drop characteristic measurement
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Application No.: US18323580Application Date: 2023-05-25
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Publication No.: US12076985B2Publication Date: 2024-09-03
- Inventor: Eashwer Chandra Vidhya Sagar Kollata , Timothy Walter Dion , Tze Hwei Tseeng
- Applicant: Kateeva, Inc.
- Applicant Address: US CA Newark
- Assignee: Kateeva, Inc.
- Current Assignee: Kateeva, Inc.
- Current Assignee Address: US CA Newark
- Agency: Hauptman Ham, LLP
- Main IPC: B41J2/045
- IPC: B41J2/045 ; G01B11/28 ; G02B26/08 ; G02B27/30

Abstract:
An inkjet printing system with a droplet measurement apparatus is described herein. The droplet measurement apparatus has a light source with a collimating optical system, an imaging device disposed along an optical path of the collimating optical system, and a droplet illumination zone in the optical path of the collimating optical system, the droplet illumination zone having a varying droplet illumination location, wherein the light source, the imaging device, or both are adjustable to place a focal plane of the imaging device at the droplet illumination location. The droplet measurement apparatus is structured to accommodate at least a portion of a dispenser of the printing system within the droplet illumination zone.
Public/Granted literature
- US20230294398A1 DROP CHARACTERISTIC MEASUREMENT Public/Granted day:2023-09-21
Information query
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